Huffman-Based Test Response Coding
نویسندگان
چکیده
Test compression / decompression is an efficient method for reducing the test application cost. In this letter we propose a response compression method based on Huffman coding. The proposed method guarantees zero-aliasing and it is independent of the fault model and the structure of a circuit-under-test. Experimental results of the compression ratio and the size of the encoder for the proposed method are presented. key words: Huffman code, test compression, test response, test application time, ATE
منابع مشابه
Improving Reusability of Test Symbols for Test Data Compression
In this paper, complementary Huffman coding techniques are proposed for test data compression/decompression of complex SOC designs during manufacturing testing. Instead of the compatible relationship between test data blocks, complementary features between test blocks are also exploited. Based on this property, more test data blocks can share the same codeword and the size of the modified Huffm...
متن کاملAnalysis of Don’t Care Bit Filling Techniques for Optimization of Compression and Scan Power
Test power and test time have been the major issues for current scenario of VLSI testing. The test data compression is the well known method used to reduce the test time. The don’t care bit filling method can be used for effective test data compression as well as reduction in scan power. In this paper we describe the algorithm for don’t care assignment like MT(Minimum Transition)-fill technique...
متن کاملPacket-Based Input Test Data Compression Techniques
1 This paper presents a test input data compression technique, which can be used to reduce input test data volume, test time, and the number of required tester channels. The technique is based on grouping data packets and applying various binary encoding techniques, such as Huffman codes and Golomb-Rice codes. Experiments on actual industrial designs and benchmark circuits show an input vector ...
متن کاملA Variable-Length Coding Adjustable for Compressed Test Application
Test compression / decompression using variable-length coding is an efficient method for reducing the test application cost, i.e., test application time and the size of the storage of an LSI tester. However, some coding techniques impose slow test application, and consequently a large test application time is required despite the high compression. In this paper, we clarify the fact that test ap...
متن کاملAn efficient test vector compression scheme using selective Huffman coding
This paper presents a compression/decompression scheme based on selective Huffman coding for reducing the amount of test data that must be stored on a tester and transferred to each core in a system-on-a-chip (SOC) during manufacturing test. The test data bandwidth between the tester and the SOC is a bottleneck that can result in long test times when testing complex SOCs that contain many cores...
متن کاملذخیره در منابع من
با ذخیره ی این منبع در منابع من، دسترسی به آن را برای استفاده های بعدی آسان تر کنید
برای دانلود متن کامل این مقاله و بیش از 32 میلیون مقاله دیگر ابتدا ثبت نام کنید
ثبت ناماگر عضو سایت هستید لطفا وارد حساب کاربری خود شوید
ورودعنوان ژورنال:
- IEICE Transactions
دوره 88-D شماره
صفحات -
تاریخ انتشار 2005